Please use this identifier to cite or link to this item:
https://thuvienso.bvu.edu.vn/handle/TVDHBRVT/18533| Title: | Field Emission Scanning Electron Microscopy |
| Other Titles: | SpringerBriefs in Applied Sciences and Technology |
| Authors: | Nicolas BroduschHendrix DemersRaynald Gauvin |
| Issue Date: | 2018 |
| Publisher: | Springer |
| URI: | http://thuvienso.bvu.edu.vn/handle/TVDHBRVT/18533 |
| Other Identifiers: | 978-981-10-4433-5 |
| Appears in Collections: | Multi-Discipline |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-981-10-4433-5.pdf | 7,23 MB | Adobe PDF | Sign in to read |
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