Please use this identifier to cite or link to this item:
https://thuvienso.bvu.edu.vn/handle/TVDHBRVT/18533Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Nicolas BroduschHendrix DemersRaynald Gauvin | |
| dc.date.accessioned | 2018-03-13T11:32:24Z | - |
| dc.date.available | 2018-03-13T11:32:24Z | - |
| dc.date.issued | 2018 | |
| dc.identifier | 978-981-10-4433-5 | |
| dc.identifier.uri | http://thuvienso.bvu.edu.vn/handle/TVDHBRVT/18533 | - |
| dc.language.iso | eng | |
| dc.publisher | Springer | |
| dc.title | Field Emission Scanning Electron Microscopy | |
| dc.title.alternative | SpringerBriefs in Applied Sciences and Technology | |
| dc.type | ebook | |
| Appears in Collections: | Multi-Discipline | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-981-10-4433-5.pdf | 7,23 MB | Adobe PDF | Sign in to read |
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