Please use this identifier to cite or link to this item:
https://thuvienso.bvu.edu.vn/handle/TVDHBRVT/18764Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Joseph I. Goldstein | |
| dc.contributor.author | Dale E. Newbury | |
| dc.contributor.author | Joseph R. Michael | |
| dc.contributor.author | Nicholas W.M. Ritchie | |
| dc.contributor.author | John Henry J. Scott | |
| dc.contributor.author | David C. Joy | |
| dc.date.accessioned | 2018-03-15T07:54:40Z | - |
| dc.date.available | 2018-03-15T07:54:40Z | - |
| dc.date.issued | 2018 | |
| dc.identifier.isbn | 978-1-4939-6676-9 | |
| dc.identifier.uri | http://thuvienso.bvu.edu.vn/handle/TVDHBRVT/18764 | - |
| dc.language.iso | eng | |
| dc.publisher | Springer | |
| dc.title | Scanning Electron Microscopy and X-Ray Microanalysis | |
| dc.type | ebook | |
| Appears in Collections: | Multi-Discipline | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 978-1-4939-6676-9.pdf | 66,74 MB | Adobe PDF |  Sign in to read |
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